EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan
- Balakrishnan, N.
- Castilla, E.
ISSN: 1099-1638, 0748-8017
Année de publication: 2022
Volumen: 38
Número: 2
Pages: 780-799
Type: Article