EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan

  1. Balakrishnan, N.
  2. Castilla, E.
Revista:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Ano de publicación: 2022

Volume: 38

Número: 2

Páxinas: 780-799

Tipo: Artigo

DOI: 10.1002/QRE.3014 GOOGLE SCHOLAR
Fonte de datos: Scopus