Characterizing a RISC-V SRAM-based FPGA implementation against Single Event Upsets using fault injection

  1. Ramos, A.
  2. Maestro, J.A.
  3. Reviriego, P.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2017

Volume: 78

Pages: 205-211

Type: Article

DOI: 10.1016/J.MICROREL.2017.09.007 GOOGLE SCHOLAR