Characterizing a RISC-V SRAM-based FPGA implementation against Single Event Upsets using fault injection
- Ramos, A.
- Maestro, J.A.
- Reviriego, P.
Revue:
Microelectronics Reliability
ISSN: 0026-2714
Année de publication: 2017
Volumen: 78
Pages: 205-211
Type: Article