Characterizing a RISC-V SRAM-based FPGA implementation against Single Event Upsets using fault injection

  1. Ramos, A.
  2. Maestro, J.A.
  3. Reviriego, P.
Revista:
Microelectronics Reliability

ISSN: 0026-2714

Ano de publicación: 2017

Volume: 78

Páxinas: 205-211

Tipo: Artigo

DOI: 10.1016/J.MICROREL.2017.09.007 GOOGLE SCHOLAR
Fonte de datos: Scopus