Efficient error detection in Double Error Correction BCH codes for memory applications

  1. Reviriego, P.
  2. Argyrides, C.
  3. A. Maestro, J.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2012

Volume: 52

Issue: 7

Pages: 1528-1530

Type: Article

DOI: 10.1016/J.MICROREL.2012.01.017 GOOGLE SCHOLAR
Data source: Scopus