A fast and efficient technique to apply Selective TMR through optimization

  1. Ruano, O.
  2. Maestro, J.A.
  3. Reviriego, P.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2011

Volume: 51

Issue: 12

Pages: 2388-2401

Type: Article

DOI: 10.1016/J.MICROREL.2011.07.020 GOOGLE SCHOLAR
Data source: Scopus