A fast and efficient technique to apply Selective TMR through optimization
- Ruano, O.
- Maestro, J.A.
- Reviriego, P.
ISSN: 0026-2714
Année de publication: 2011
Volumen: 51
Número: 12
Pages: 2388-2401
Type: Article
Revue:
Microelectronics Reliability