Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

  1. Servin, M.
  2. Quiroga, J.A.
  3. Padilla, M.

ISBN: 9783527411528

Year of publication: 2014

Volume: 9783527411528

Pages: 1-327

Type: Book

DOI: 10.1002/9783527681075 GOOGLE SCHOLAR
Data source: Scopus