Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
- Servin, M.
- Quiroga, J.A.
- Padilla, M.
ISBN: 9783527411528
Année de publication: 2014
Volumen: 9783527411528
Pages: 1-327
Type: Livre
ISBN: 9783527411528
Année de publication: 2014
Volumen: 9783527411528
Pages: 1-327
Type: Livre