Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques
- Panin, GN
- Diaz-Guerra, C
- Piqueras, J
ISSN: 1026-3489
Year of publication: 1998
Volume: 62
Issue: 3
Pages: 461-466
Type: Article
Journal:
IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA