Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques
- Panin, GN
- Diaz-Guerra, C
- Piqueras, J
ISSN: 1026-3489
Année de publication: 1998
Volumen: 62
Número: 3
Pages: 461-466
Type: Article
ISSN: 1026-3489
Année de publication: 1998
Volumen: 62
Número: 3
Pages: 461-466
Type: Article