Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs

  1. Antonio Clemente, Juan
  2. Franco, Francisco J.
  3. Villa, Francesca
  4. Baylac, Maud
  5. Rey, Solenne
  6. Mecha, Hortensia
  7. Agapito, Juan A.
  8. Puchner, Helmut
  9. Hubert, Guillaume
  10. Velazco, Raoul
Llibre:
2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)

ISBN: 978-1-5090-0232-0

Any de publicació: 2015

Congrés: 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Tipus: Aportació congrés

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Fuente de los datos: WoS