Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs

  1. Antonio Clemente, Juan
  2. Franco, Francisco J.
  3. Villa, Francesca
  4. Baylac, Maud
  5. Rey, Solenne
  6. Mecha, Hortensia
  7. Agapito, Juan A.
  8. Puchner, Helmut
  9. Hubert, Guillaume
  10. Velazco, Raoul
Libro:
2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)

ISBN: 978-1-5090-0232-0

Ano de publicación: 2015

Congreso: 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Tipo: Achega congreso

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Fonte de datos: WoS