Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs

  1. Antonio Clemente, Juan
  2. Franco, Francisco J.
  3. Villa, Francesca
  4. Baylac, Maud
  5. Rey, Solenne
  6. Mecha, Hortensia
  7. Agapito, Juan A.
  8. Puchner, Helmut
  9. Hubert, Guillaume
  10. Velazco, Raoul
Book:
2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)

ISBN: 978-1-5090-0232-0

Year of publication: 2015

Congress: 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Type: Conference paper

GOOGLE SCHOLAR
Data source: WoS