Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs

  1. Antonio Clemente, Juan
  2. Franco, Francisco J.
  3. Villa, Francesca
  4. Baylac, Maud
  5. Rey, Solenne
  6. Mecha, Hortensia
  7. Agapito, Juan A.
  8. Puchner, Helmut
  9. Hubert, Guillaume
  10. Velazco, Raoul
Liburua:
2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)

ISBN: 978-1-5090-0232-0

Argitalpen urtea: 2015

Biltzarra: 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Mota: Biltzar ekarpena

GOOGLE SCHOLAR
Datuen iturria: WoS