Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs
- Antonio Clemente, Juan
- Franco, Francisco J.
- Villa, Francesca
- Baylac, Maud
- Rey, Solenne
- Mecha, Hortensia
- Agapito, Juan A.
- Puchner, Helmut
- Hubert, Guillaume
- Velazco, Raoul
Buch:
2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)
ISBN: 978-1-5090-0232-0
Datum der Publikation: 2015
Kongress: 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
Art: Konferenz-Beitrag