Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions

  1. Chen, X.
  2. Hu, H.
  3. Trasobares, J.
  4. Nijhuis, C.A.
Aldizkaria:
ACS Applied Materials and Interfaces

ISSN: 1944-8252,  1944-8244

Argitalpen urtea: 2019

Alea: 11

Zenbakia: 23

Orrialdeak: 21018-21029

Mota: Artikulua

DOI: 10.1021/ACSAMI.9B02033 GOOGLE SCHOLAR
Datuen iturria: Scopus