Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions

  1. Chen, X.
  2. Hu, H.
  3. Trasobares, J.
  4. Nijhuis, C.A.
Revista:
ACS Applied Materials and Interfaces

ISSN: 1944-8252,  1944-8244

Ano de publicación: 2019

Volume: 11

Número: 23

Páxinas: 21018-21029

Tipo: Artigo

DOI: 10.1021/ACSAMI.9B02033 GOOGLE SCHOLAR
Fonte de datos: Scopus