Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions

  1. Chen, X.
  2. Hu, H.
  3. Trasobares, J.
  4. Nijhuis, C.A.
Revue:
ACS Applied Materials and Interfaces

ISSN: 1944-8252,  1944-8244

Année de publication: 2019

Volumen: 11

Número: 23

Pages: 21018-21029

Type: Article

DOI: 10.1021/ACSAMI.9B02033 GOOGLE SCHOLAR
La source de données: Scopus