A new estimation approach based on phi-divergence measures for one-shot device accelerated life testing
ISSN: 1099-1638, 0748-8017
Year of publication: 2024
Volume: 40
Issue: 4
Pages: 2048-2066
Type: Article
ISSN: 1099-1638, 0748-8017
Year of publication: 2024
Volume: 40
Issue: 4
Pages: 2048-2066
Type: Article