A new estimation approach based on phi-divergence measures for one-shot device accelerated life testing

  1. Castilla, E.
Aldizkaria:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Argitalpen urtea: 2024

Alea: 40

Zenbakia: 4

Orrialdeak: 2048-2066

Mota: Artikulua

DOI: 10.1002/QRE.3507 GOOGLE SCHOLAR lock_openSarbide irekia editor

Objetivos de desarrollo sostenible

Datuen iturria: Scopus