A new estimation approach based on phi-divergence measures for one-shot device accelerated life testing

  1. Castilla, E.
Revue:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Année de publication: 2024

Type: Article

DOI: 10.1002/QRE.3507 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus