Física de Materiales
Departamento
Instituto de Ciencias de la Tierra Jaume Almera
Barcelona, EspañaPublicaciones en colaboración con investigadores/as de Instituto de Ciencias de la Tierra Jaume Almera (18)
2011
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UV and visible Raman scattering of ultraheavily Ti implanted Si layers for intermediate band formation
Semiconductor Science and Technology, Vol. 26, Núm. 11
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Visible and UV Raman scattering study of lattice recovery on Ti implanted silicon layers
Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011
2010
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Raman and rutherford backscattering characterization of Ti implanted Si above Mott limit
Materials Research Society Symposium Proceedings
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Ti-doped gallium phosphide layers with concentrations above the Mott limit
Materials Research Society Symposium Proceedings
2009
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Laser thermal annealing effects on single crystal gallium phosphide
Journal of Applied Physics, Vol. 106, Núm. 5
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Pulsed laser melting effects on single crystal gallium phosphide
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
2008
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Raman scattering and cathodoluminescence characterization of near lattice-matched InxAl1-xN epilayers
Semiconductor Science and Technology, Vol. 23, Núm. 10
2007
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Crystal damage assessment of Be+-implanted GaN by UV Raman scattering
Semiconductor Science and Technology, Vol. 22, Núm. 2, pp. 70-73
2006
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Lattice order in thulium-doped GaN epilayers: In situ doping versus ion implantation
Optical Materials
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Structural and optical properties of MOCVD InAIN epilayers
Materials Research Society Symposium Proceedings
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Substrate influence on the high-temperature annealing behavior of GaN: Si vs. sapphire
Materials Research Society Symposium Proceedings
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The effect of substrate on high-temperature annealing of GaN epilayers: Si versus sapphire
Journal of Applied Physics, Vol. 100, Núm. 4
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UV-Raman scattering study of lattice recovery by thermal annealing of Eu+ -implanted GaN layers
Superlattices and Microstructures, Vol. 40, Núm. 4-6 SPEC. ISS., pp. 440-444
2005
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Electrical characterisation of (Ga,Mn,Cr)As thin films grown by molecular beam epitaxy
Journal of Crystal Growth
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Optical characterisation of Bi-doped GaN films grown by molecular beam epitaxy
Physica Status Solidi (A) Applications and Materials Science
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Raman-scattering study of the InGaN alloy over the whole composition range
Journal of Applied Physics, Vol. 98, Núm. 1
2004
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Local vibrational modes of H complexes in Mg-doped GaN grown by molecular beam epitaxy
Applied Physics Letters, Vol. 84, Núm. 6, pp. 897-899
2003
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Hydrogen-related local vibrational modes in GaN:Mg grown by molecular beam epitaxy
Materials Research Society Symposium - Proceedings