Publications in collaboration with researchers from Grenoble Alpes University (25)

2023

  1. Layered Decoding of Quantum LDPC Codes

    2023 12th International Symposium on Topics in Coding, ISTC 2023

2022

  1. Machine Learning in Pansharpening: A benchmark, from shallow to deep networks

    IEEE Geoscience and Remote Sensing Magazine, Vol. 10, Núm. 3, pp. 279-315

2020

  1. Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1547-1554

  2. Learning Specifications for Labelled Patterns

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  3. Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1461-1469

2018

  1. MoDeVVa 2018 15 th workshop on model-driven engineering, verification and validation

    CEUR Workshop Proceedings

  2. Agreement technologies for energy optimization at home

    Sensors (Switzerland), Vol. 18, Núm. 5

  3. EnerVMAS: Virtual agent organizations to optimize energy consumption using intelligent temperature calibration

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  4. On-the-fly model checking for extended action-based probabilistic operators

    International Journal on Software Tools for Technology Transfer, Vol. 20, Núm. 5, pp. 563-587

  5. SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2-MeV Neutrons

    IEEE Transactions on Nuclear Science, Vol. 65, Núm. 8, pp. 1858-1865

2017

  1. Preface: Special issue on software verification and testing

    Journal of Systems and Software

  2. Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias Voltage

    IEEE Transactions on Nuclear Science, Vol. 64, Núm. 8, pp. 2188-2195

  3. Statistical Deviations from the Theoretical Only-SBU Model to Estimate MCU Rates in SRAMs

    IEEE Transactions on Nuclear Science, Vol. 64, Núm. 8, pp. 2152-2160

2016

  1. Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons

    IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2193-2200

  2. Evaluation of the sensitivity of a COTS 90-nm SRAM memory at low bias voltage

    Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

  3. Single events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons

    IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2072-2079

  4. Some properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs

    Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS