UNIFORMITY CHARACTERIZATION OF SI-GAAS BY CATHODOLUMINESCENCE AND SCANNING ELECTRON ACOUSTIC MICROSCOPY
- MENDEZ, B
- PIQUERAS, J
- CULLIS, AG (coord.)
- HUTCHINSON, JL (coord.)
ISBN: 0-85498-056-3
Year of publication: 1989
Volume: 100
Pages: 789-794
Congress: CONF ON MICROSCOPY OF SEMICONDUCTING MATERIALS
Type: Conference paper