UNIFORMITY CHARACTERIZATION OF SI-GAAS BY CATHODOLUMINESCENCE AND SCANNING ELECTRON ACOUSTIC MICROSCOPY

  1. MENDEZ, B
  2. PIQUERAS, J
Liburu bilduma:
MICROSCOPY OF SEMICONDUCTING MATERIALS 1989
  1. CULLIS, AG (coord.)
  2. HUTCHINSON, JL (coord.)

ISBN: 0-85498-056-3

Argitalpen urtea: 1989

Alea: 100

Orrialdeak: 789-794

Biltzarra: CONF ON MICROSCOPY OF SEMICONDUCTING MATERIALS

Mota: Biltzar ekarpena

GOOGLE SCHOLAR
Datuen iturria: WoS