UNIFORMITY CHARACTERIZATION OF SI-GAAS BY CATHODOLUMINESCENCE AND SCANNING ELECTRON ACOUSTIC MICROSCOPY

  1. MENDEZ, B
  2. PIQUERAS, J
Collection de livres:
MICROSCOPY OF SEMICONDUCTING MATERIALS 1989
  1. CULLIS, AG (coord.)
  2. HUTCHINSON, JL (coord.)

ISBN: 0-85498-056-3

Année de publication: 1989

Volumen: 100

Pages: 789-794

Congreso: CONF ON MICROSCOPY OF SEMICONDUCTING MATERIALS

Type: Communication dans un congrès

GOOGLE SCHOLAR
La source de données: WoS