UNIFORMITY CHARACTERIZATION OF SI-GAAS BY CATHODOLUMINESCENCE AND SCANNING ELECTRON ACOUSTIC MICROSCOPY
- MENDEZ, B
- PIQUERAS, J
- CULLIS, AG (coord.)
- HUTCHINSON, JL (coord.)
ISBN: 0-85498-056-3
Ano de publicación: 1989
Volume: 100
Páxinas: 789-794
Congreso: CONF ON MICROSCOPY OF SEMICONDUCTING MATERIALS
Tipo: Achega congreso