FRANCISCO JAVIER
FRANCO PELÁEZ
Catedrático de universidad
JUAN CARLOS
FABERO JIMÉNEZ
Profesor contratado doctor
Publicacións nas que colabora con JUAN CARLOS FABERO JIMÉNEZ (12)
2024
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LELAPE: An Open-Source Tool to Classify SEUs According to Their Multiplicity in Radiation-Ground Tests on Memories
IEEE Transactions on Nuclear Science, Vol. 71, Núm. 10, pp. 2260-2271
2023
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SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles
Microprocessors and Microsystems, Vol. 96
2022
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Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation
IEEE Transactions on Nuclear Science, Vol. 69, Núm. 2, pp. 126-133
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Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories
IEEE Access, Vol. 10, pp. 114566-114585
2021
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Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs
2021 IEEE 22nd Latin American Test Symposium, LATS 2021
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Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs
RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems
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Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles
2021 IEEE 22nd Latin American Test Symposium, LATS 2021
2020
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Evaluation of a COTS 65-nm SRAM under 15 MeV Protons and 14 MeV Neutrons at Low VDD
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 10, pp. 2188-2195
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Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 11, pp. 2345-2352
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Impact of High Particle Flux in Radiation Ground Tests with Protons
2020 20th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2020 - Proceedings
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Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1547-1554
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Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode
IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1461-1469