Publicaciones en las que colabora con JUAN ANTONIO CLEMENTE BARREIRA (12)

2024

  1. Non-intrusive study on FPGA of the SEU sensitivity on the COTS RISC-V VeeR EH1 soft processor from Western Digital

    Microprocessors and Microsystems, Vol. 105

2023

  1. SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles

    Microprocessors and Microsystems, Vol. 96

2022

  1. Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation

    IEEE Transactions on Nuclear Science, Vol. 69, Núm. 2, pp. 126-133

  2. Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories

    IEEE Access, Vol. 10, pp. 114566-114585

2021

  1. Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs

    2021 IEEE 22nd Latin American Test Symposium, LATS 2021

  2. Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs

    RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems

  3. Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles

    2021 IEEE 22nd Latin American Test Symposium, LATS 2021

2020

  1. Evaluation of a COTS 65-nm SRAM under 15 MeV Protons and 14 MeV Neutrons at Low VDD

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 10, pp. 2188-2195

  2. Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 11, pp. 2345-2352

  3. Impact of High Particle Flux in Radiation Ground Tests with Protons

    2020 20th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2020 - Proceedings

  4. Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1547-1554

  5. Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1461-1469