Publicaciones en colaboración con investigadores/as de Grenoble Alpes University (25)

2023

  1. Layered Decoding of Quantum LDPC Codes

    2023 12th International Symposium on Topics in Coding, ISTC 2023

2022

  1. Machine Learning in Pansharpening: A benchmark, from shallow to deep networks

    IEEE Geoscience and Remote Sensing Magazine, Vol. 10, Núm. 3, pp. 279-315

2020

  1. Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1547-1554

  2. Learning Specifications for Labelled Patterns

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  3. Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1461-1469

2018

  1. MoDeVVa 2018 15 th workshop on model-driven engineering, verification and validation

    CEUR Workshop Proceedings

  2. Agreement technologies for energy optimization at home

    Sensors (Switzerland), Vol. 18, Núm. 5

  3. EnerVMAS: Virtual agent organizations to optimize energy consumption using intelligent temperature calibration

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  4. On-the-fly model checking for extended action-based probabilistic operators

    International Journal on Software Tools for Technology Transfer, Vol. 20, Núm. 5, pp. 563-587

  5. SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2-MeV Neutrons

    IEEE Transactions on Nuclear Science, Vol. 65, Núm. 8, pp. 1858-1865

2017

  1. Preface: Special issue on software verification and testing

    Journal of Systems and Software

  2. Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias Voltage

    IEEE Transactions on Nuclear Science, Vol. 64, Núm. 8, pp. 2188-2195

  3. Statistical Deviations from the Theoretical Only-SBU Model to Estimate MCU Rates in SRAMs

    IEEE Transactions on Nuclear Science, Vol. 64, Núm. 8, pp. 2152-2160

2016

  1. Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons

    IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2193-2200

  2. Evaluation of the sensitivity of a COTS 90-nm SRAM memory at low bias voltage

    Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

  3. Single events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons

    IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2072-2079

  4. Some properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs

    Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS