Publicaciones en colaboración con investigadores/as de Grenoble Alpes University (12)

2020

  1. Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1547-1554

  2. Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

    IEEE Transactions on Nuclear Science, Vol. 67, Núm. 7, pp. 1461-1469

2019

  1. Influence of randomness during the interpretation of results from single-event experiments on SRAMs

    IEEE Transactions on Device and Materials Reliability, Vol. 19, Núm. 1, pp. 104-111

2018

  1. SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2-MeV Neutrons

    IEEE Transactions on Nuclear Science, Vol. 65, Núm. 8, pp. 1858-1865

2017

  1. Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias Voltage

    IEEE Transactions on Nuclear Science, Vol. 64, Núm. 8, pp. 2188-2195

  2. Statistical Deviations from the Theoretical Only-SBU Model to Estimate MCU Rates in SRAMs

    IEEE Transactions on Nuclear Science, Vol. 64, Núm. 8, pp. 2152-2160

2016

  1. Evaluation of the sensitivity of a COTS 90-nm SRAM memory at low bias voltage

    Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

  2. Single events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons

    IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2072-2079

  3. Some properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs

    Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

  4. Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs

    IEEE Transactions on Nuclear Science, Vol. 63, Núm. 4, pp. 2087-2094

2015

  1. Neutron-induced single events in a COTS soft-error free SRAM at low bias voltage

    Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

  2. Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs

    Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS