Publicaciones en colaboración con investigadores/as de McMaster University (11)

2023

  1. Power divergence approach for one-shot device testing under competing risks

    Journal of Computational and Applied Mathematics, Vol. 419

  2. Robust estimation based on one-shot device test data under log-normal lifetimes

    Statistics, Vol. 57, Núm. 5, pp. 1061-1086

  3. Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

    Quality and Reliability Engineering International, Vol. 39, Núm. 4, pp. 1192-1222

2022

  1. EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan

    Quality and Reliability Engineering International, Vol. 38, Núm. 2, pp. 780-799

  2. Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis

    Quality and Reliability Engineering International, Vol. 38, Núm. 2, pp. 989-1012

2021

  1. Divergence-Based Robust Inference under Proportional Hazards Model for One-Shot Device Life-Test

    IEEE Transactions on Reliability, Vol. 70, Núm. 4, pp. 1355-1367

2020

  1. Robust Inference for One-Shot Device Testing Data under Weibull Lifetime Model

    IEEE Transactions on Reliability, Vol. 69, Núm. 3, pp. 937-953

  2. Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses

    Quality and Reliability Engineering International, Vol. 36, Núm. 6, pp. 1916-1930