ELENA MARÍA
CASTILLA GONZÁLEZ
Profesora ayudante
McMaster University
Hamilton, CanadáPublicaciones en colaboración con investigadores/as de McMaster University (11)
2024
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Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks
Journal of Computational and Applied Mathematics, Vol. 437
2023
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Power divergence approach for one-shot device testing under competing risks
Journal of Computational and Applied Mathematics, Vol. 419
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Robust estimation based on one-shot device test data under log-normal lifetimes
Statistics, Vol. 57, Núm. 5, pp. 1061-1086
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Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes
Quality and Reliability Engineering International, Vol. 39, Núm. 4, pp. 1192-1222
2022
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EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan
Quality and Reliability Engineering International, Vol. 38, Núm. 2, pp. 780-799
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Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis
Quality and Reliability Engineering International, Vol. 38, Núm. 2, pp. 989-1012
2021
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Divergence-Based Robust Inference under Proportional Hazards Model for One-Shot Device Life-Test
IEEE Transactions on Reliability, Vol. 70, Núm. 4, pp. 1355-1367
2020
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Robust Inference for One-Shot Device Testing Data under Weibull Lifetime Model
IEEE Transactions on Reliability, Vol. 69, Núm. 3, pp. 937-953
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Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses
Quality and Reliability Engineering International, Vol. 36, Núm. 6, pp. 1916-1930
2019
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Robust Estimators and Test Statistics for One-Shot Device Testing under the Exponential Distribution
IEEE Transactions on Information Theory, Vol. 65, Núm. 5, pp. 3080-3096
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Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data
Metrika, Vol. 82, Núm. 8, pp. 991-1019