Publicaciones en colaboración con investigadores/as de McMaster University (19)

2024

  1. Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution

    Journal of Computational and Applied Mathematics, Vol. 437

  2. Robust inference for an interval-monitored step-stress experiment with competing risks for failure with an application to capacitor data

    Computers and Industrial Engineering, Vol. 197

  3. Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks

    Journal of Computational and Applied Mathematics, Vol. 437

  4. Step-stress tests for interval-censored data under gamma lifetime distribution

    Quality Engineering, Vol. 36, Núm. 1, pp. 3-20

2023

  1. Power divergence approach for one-shot device testing under competing risks

    Journal of Computational and Applied Mathematics, Vol. 419

  2. Preface

    Studies in Systems, Decision and Control

  3. Robust estimation based on one-shot device test data under log-normal lifetimes

    Statistics, Vol. 57, Núm. 5, pp. 1061-1086

  4. Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

    Quality and Reliability Engineering International, Vol. 39, Núm. 4, pp. 1192-1222

2022

  1. EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan

    Quality and Reliability Engineering International, Vol. 38, Núm. 2, pp. 780-799

  2. Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis

    Quality and Reliability Engineering International, Vol. 38, Núm. 2, pp. 989-1012

2021

  1. Divergence-Based Robust Inference under Proportional Hazards Model for One-Shot Device Life-Test

    IEEE Transactions on Reliability, Vol. 70, Núm. 4, pp. 1355-1367

2020

  1. Robust Inference for One-Shot Device Testing Data under Weibull Lifetime Model

    IEEE Transactions on Reliability, Vol. 69, Núm. 3, pp. 937-953

  2. Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses

    Quality and Reliability Engineering International, Vol. 36, Núm. 6, pp. 1916-1930

2019

  1. Robust Estimators and Test Statistics for One-Shot Device Testing under the Exponential Distribution

    IEEE Transactions on Information Theory, Vol. 65, Núm. 5, pp. 3080-3096

  2. Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data

    Metrika, Vol. 82, Núm. 8, pp. 991-1019

2017

  1. Empirical phi-divergence test statistics for the difference of means of two populations

    AStA Advances in Statistical Analysis, Vol. 101, Núm. 2, pp. 199-226

2015

  1. Empirical phi-divergence test statistics for testing simple and composite null hypotheses

    Statistics, Vol. 49, Núm. 5, pp. 951-977

2013

  1. Empirical phi-divergence test statistics for testing simple and composite null hypotheses

    XXXIV Congreso Nacional de Estadística e Investigación Operativa, VIII Jornadas de Estadística Pública: SEIO 2013. Universitat Jaume I, Castellón, septiembre 2013. Libro de actas

  2. Hypothesis testing in a generic nesting framework for general distributions

    Journal of Multivariate Analysis, Vol. 118, pp. 1-23