Informática
Facultad
ENRIQUE
SAN ANDRÉS SERRANO
Catedrático de universidad
Publicaciones en las que colabora con ENRIQUE SAN ANDRÉS SERRANO (51)
2024
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Native Oxide Layer Role during Cryogenic-Temperature Ion Implantations in Germanium
Physica Status Solidi (A) Applications and Materials Science
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Optical, Electrical, and Optoelectronic Characterization of Ti-Supersaturated Gallium Arsenide
Physica Status Solidi (A) Applications and Materials Science
2023
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Electronic transport properties of Ti-supersaturated Si processed by rapid thermal annealing or pulsed-laser melting
Semiconductor Science and Technology, Vol. 38, Núm. 2
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Fabrication of TiOx, by High Pressure Sputtering for Selective Contact in Photovoltaic Cells
2023 14th Spanish Conference on Electron Devices (CDE)
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High Pressure Sputtering of Mo Targets in Mixed Ar/O2/H2Atmospheres for Hole Selective Contacts in Photovoltaic Cells
2023 14th Spanish Conference on Electron Devices (CDE)
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High-quality single-crystalline epitaxial regrowth on pulsed laser melting of Ti implanted GaAs
Materials Science in Semiconductor Processing, Vol. 153
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Inversion Charge Study in TMO Hole-Selective Contact-Based Solar Cells
IEEE Journal of Photovoltaics, Vol. 13, Núm. 5, pp. 656-662
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Ti supersaturated Si by microwave annealing processes
Semiconductor Science and Technology, Vol. 38, Núm. 2
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Transport mechanisms in hyperdoped silicon solar cells
Semiconductor Science and Technology, Vol. 38, Núm. 12
2022
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Electrical transport properties in Ge hyperdoped with Te
Semiconductor Science and Technology, Vol. 37, Núm. 12
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Indium tin oxide obtained by high pressure sputtering for emerging selective contacts in photovoltaic cells
Materials Science in Semiconductor Processing, Vol. 137
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On the Optoelectronic Mechanisms Ruling Ti-hyperdoped Si Photodiodes
Advanced Electronic Materials, Vol. 8, Núm. 2
2021
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High Pressure Sputtering of materials for selective contacts in emerging photovoltaic cells
Proceedings of the 2021 13th Spanish Conference on Electron Devices, CDE 2021
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Overcoming the solid solubility limit of Te in Ge by ion implantation and pulsed laser melting recrystallization
Proceedings of the 2021 13th Spanish Conference on Electron Devices, CDE 2021
2017
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A robust method to determine the contact resistance using the van der Pauw set up
Measurement: Journal of the International Measurement Confederation, Vol. 98, pp. 151-158
2014
2013
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High pressure sputtering as a viable technique for future high permittivity dielectric on III-V integration: GdOx on InP demonstration
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, Vol. 31, Núm. 1
2011
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Anomalous thermal oxidation of gadolinium thin films deposited on silicon by high pressure sputtering
Microelectronic Engineering, Vol. 88, Núm. 9, pp. 2991-2996
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Electrical characterization of high-pressure reactive sputtered ScO x films on silicon
Thin Solid Films, Vol. 519, Núm. 7, pp. 2268-2272
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Towards metal electrode interface scavenging of rare-earth scandates: A Sc2O3 and Gd2O3 study
Microelectronic Engineering